SN74LS165N (74LS165) shift register
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Description:
The SN74LS165N IC is designed to facilitate the conversion of parallel data inputs into serial data output. It features an 8-bit shift register where data can be loaded in parallel using D0 to D7 inputs and shifted out serially through the Q7 output. The shift operation is synchronized with the rising edge of the clock input (CLK), allowing precise control over data transfer. This IC is known for its robust performance in digital circuits requiring serial data manipulation and control.
Key Features:
- 8-bit parallel-in/serial-out shift register
- Low-power Schottky TTL technology
- Wide operating voltage range: 4.75V to 5.25V
- Typical shift clock frequency: 35 MHz at VCC = 5V
- High output drive capability: ±8 mA at VCC = 5V
- Direct compatibility with TTL input levels
- Schmitt-trigger inputs for improved noise immunity
- Package Type: 16-pin DIP (Dual In-line Package)
- Supply Voltage (VCC): 4.75V to 5.25V
- Input Voltage (VIN): 0V to VCC
- Output Voltage (VOUT): 0V to VCC
- Input High Voltage (VIH): 2V (min) at VCC = 5V
- Input Low Voltage (VIL): 0.8V (max) at VCC = 5V
- Output Current (IOH, IOL): ±8 mA (max)
- Quiescent Supply Current (ICC): 8 mA (max)
- Operating Temperature Range: 0°C to +70°C
- Parallel-to-serial data conversion
- Data storage and transfer in microcontroller interfacing
- Shift register applications in LED displays and digital counters
- Serial data input for microprocessor peripherals
- Control and synchronization in digital communication systems
Technical Specifications:
- Logic Family: CMOS
- Number of Channels: 3
- Switch Configuration: Single-Pole Double-Throw (SPDT)
- Supply Voltage Range: 3V to 15V
- “ON” Resistance (R_ON): 125Ω typical at V_DD = 10V
- “OFF” Leakage Current (I_OFF): ±100pA typical at V_DD = 10V
- Control Input Voltage (V_IH): 0.7 V_DD min, 0.3 V_DD max
- Maximum Operating Frequency: 40 MHz at V_DD = 10V
Applications:
- Signal routing and switching
- Analog and digital multiplexing
- Audio and video signal processing
- Data acquisition systems
- Test equipment