SN74LS145N (74LS145) Decimal decoder
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Description:
The SN74LS145N IC takes a 4-bit binary-coded input (BCD) and decodes it into one of ten outputs corresponding to the decimal values 0 through 9. It operates with a latch enable (LE) input that controls the data storage and a ripple-blanking (RB) input for suppressing false outputs due to momentary glitches. This IC is commonly used in applications where binary-coded data from digital systems needs to be converted into a form suitable for driving displays or other output devices.
Key Features:
- BCD to decimal decoding functionality
- Low-power Schottky TTL technology
- Wide operating voltage range: 4.75V to 5.25V
- Typical propagation delay: 21 ns at VCC = 5V, CL = 15 pF
- High output drive capability: ±8 mA at VCC = 5V
- Direct compatibility with TTL input levels
- Schmitt-trigger inputs for improved noise immunity
- Package Type: 16-pin DIP (Dual In-line Package)
- Supply Voltage (VCC): 4.75V to 5.25V
- Input Voltage (VIN): 0V to VCC
- Output Voltage (VOUT): 0V to VCC
- Input High Voltage (VIH): 2V (min) at VCC = 5V
- Input Low Voltage (VIL): 0.8V (max) at VCC = 5V
- Output Current (IOH, IOL): ±8 mA (max)
- Quiescent Supply Current (ICC): 8 mA (max)
- Operating Temperature Range: 0°C to +70°C
- BCD to decimal conversion in digital panel meters
- Seven-segment display decoding in digital clocks and calculators
- Signal decoding in electronic scoring systems
- Data decoding in digital control systems
- Binary data manipulation in microprocessor interfaces
Technical Specifications:
- Logic Family: CMOS
- Number of Channels: 3
- Switch Configuration: Single-Pole Double-Throw (SPDT)
- Supply Voltage Range: 3V to 15V
- “ON” Resistance (R_ON): 125Ω typical at V_DD = 10V
- “OFF” Leakage Current (I_OFF): ±100pA typical at V_DD = 10V
- Control Input Voltage (V_IH): 0.7 V_DD min, 0.3 V_DD max
- Maximum Operating Frequency: 40 MHz at V_DD = 10V
Applications:
- Signal routing and switching
- Analog and digital multiplexing
- Audio and video signal processing
- Data acquisition systems
- Test equipment